The Next-Generation Embedded Security Testbench addresses these pain points by providing a unified and efficient comprehensive device security analysis platform.

One such solution applies embedded deterministic test patterns in-system via industry-standard APB or AXI bus interfaces.

This year, Taiwanese chipmakers are participating extensively in Embedded World 2025. Many industry players have openly stated that in the past few years, downstream solution providers have taken ...

TYSONS CORNER, VA, April 23, 2021 — Science Applications International Corp. (NYSE: SAIC) and its small business partners will provide embedded system testing support under a potential $3.6 ...

The most widely adopted methods for testing wire bond defects are optical / X-ray inspection using automated X-ray inspection (AXI) and electrical test methods using automated test equipment (ATE).

Views on the ways AI is changing test & measurement. What is the trustworthiness of AI? Artificial intelligence (AI) has the potential to transform every stage of product lifecycles, from design ...

The National Information Technology Development Agency (NITDA) has issued a public alert over newly discovered critical security vulnerability in embedded SIM (eSIM) cards, now being deployed by ...

Develop IoT solutions leveraging in-sensor AI and ST components using the machine-learning core of the company's MEMS sensors to deploy sensor-to-cloud solutions.