Features 1. In-lens Schottky Plus field emission electron gun Enhanced integration of the electron gun and low-aberration condenser lens provides higher brightness.

Engineers have developed a lanthanum hexaboride (LaB6) nanowire-based field emission gun that is installable on an aberration-corrected transmission electron microscope (TEM). This combined unit ...

Today, ZEISS is introducing its new integrated in situ workflow for ZEISS field emission scanning electron microscopes (FE-SEM). When researchers need to link material performance to microstructure, ...

JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announces the development and release of a new scanning electron microscope (SEM), the JSM-IT510 ...

Researchers have developed a high-speed 3D imaging microscope that can capture detailed cell dynamics of an entire small whole organism at once. The ability to image 3D changes in real time over a ...